Springer Theses Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Ma, (Hardcover)
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US$43.16
Price when purchased online
Free shipping
Free 30-day returns
Sold and shipped by fdemartires.es
Free 30-day returns Details
Product details
| Management number | 251700433 | Release Date | 2026/09/26 | List Price | US$43.16 | Model Number | 251700433 | ||
|---|---|---|---|---|---|---|---|---|---|
| Category | |||||||||
This book lays the groundwork for further use of Electron Spin Echo Envelop Modulation (ESEEM) and opens the possibility of highly precise chemical fingerprinting. It reveals an astonishingly long memory of spin coherence in semiconductor particles.
- Springer Theses Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Ma, (Hardcover)
- Author: Kipp Van Schooten
- ISBN: 9783319005898
- Format: Hardcover
- Publication Date: 2013-07-30
- Page Count: 90
| Manual & guide type | Instruction Manual |
|---|---|
| Book format | Hardcover |
| Edition | 2013 Edition |
| Pages | 90 |
| Language | English |
| Brand | Kipp Van Schooten |
| Pub date | 20130730 |
| Author | Kipp Van Schooten |
| Subgenre | Electronics |
| Genre | Computing & Internet |
| Bisac subject heading | Technology & Engineering |
| Series title | Springer Theses |
| Number in series | 0 |
| Dimensions | 6.00 x 0.50 x 9.20 in |
| Age group | Adult |
| Piece count | 0 |
| Retail packaging | Single Piece |
| Original languages | English |
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